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Temperature dependence of the interface moments in Co2MnSi thin films

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posted on 2025-07-30, 14:43 authored by N.D. Telling, Paul Steven Keatley, L.R. Shelford, E. Arenholz, Gerrit van der Laan, R.J. Hicken, Y. Sakuraba, S. Tsunegi, M. Oogane, Y. Ando, K. Takanashi, T. Miyazaki
X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co2MnSi (CMS) thin films capped with aluminum. By increasing the thickness of the capping layer, we demonstrate enhanced interface sensitivity of the measurements. L2(1)-ordered CMS films show no significant temperature dependence of either the Co or Mn interface moments. However, disordered CMS films show a decreased moment at low temperature possibly caused by increased Mn-Mn antiferromagnetic coupling. It is suggested that for ordered L2(1) CMS films the temperature dependence of the tunneling magnetoresistance is not related to changes in the interface moments.

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    DOI - References https://doi.org/10.1063/1.2927482
  2. 2.
    EISSN - Is published in https://portal.issn.org/resource/ISSN/1077-3118
  3. 3.
    ISSN - Is published in https://portal.issn.org/resource/ISSN/0003-6951

Notes

Copyright © 2008 American Institute of Physics

External DOI

Journal

Applied Physics Letters

Publisher

American Institute of Physics

Language

en

Citation

Vol. 92 (19), article 192503

Department

  • Physics and Astronomy

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    Keywords

    magnetic tunnel junctionsspin polarizationmagnetoresistancespectroscopyaluminiumantiferromagnetismcobalt alloysinterface magnetismmagnetic circular dichroismmagnetic thin filmsmanganese alloyssilicon alloystunnelling magnetoresistanceX-ray absorption spectra

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