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dc.contributor.authorWright, C. Daviden_GB
dc.contributor.authorAziz, Mustafa M.en_GB
dc.contributor.authorShah, P.en_GB
dc.contributor.authorWang, Leien_GB
dc.date.accessioned2012-09-28T18:02:50Zen_GB
dc.date.accessioned2013-03-20T12:21:36Z
dc.date.issued2011-03en_GB
dc.identifier.citationVol. 11 (2), pp. E104 - E109en_GB
dc.identifier.doi10.1016/j.cap.2010.11.130en_GB
dc.identifier.urihttp://hdl.handle.net/10036/3785en_GB
dc.subjectScanned probe memoriesen_GB
dc.subjectPhase-change memoriesen_GB
dc.subjectPolymer memoriesen_GB
dc.subjectFerroelectric memoriesen_GB
dc.titleScanning probe memories - Technology and applicationsen_GB
dc.date.available2012-09-28T18:02:50Zen_GB
dc.date.available2013-03-20T12:21:36Z
dc.identifier.issn1567-1739en_GB
dc.identifier.journalCurrent Applied Physicsen_GB


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