Phase-Change and Carbon Based Materials for Advanced Memory and Computing Devices
Hosseini, Peiman
Date: 5 March 2013
Thesis or dissertation
Publisher
University of Exeter
Degree Title
Doctor of Philosophy in Engineering
Abstract
The aggressive scaling of CMOS technology, to reduce device size while also
increasing device performance, has reached a point where continuing
improvement is becoming increasingly problematic and alternative routes for the
development of future memory and processing devices may be necessary; in this
thesis the use of phase-change ...
The aggressive scaling of CMOS technology, to reduce device size while also
increasing device performance, has reached a point where continuing
improvement is becoming increasingly problematic and alternative routes for the
development of future memory and processing devices may be necessary; in this
thesis the use of phase-change and carbon based materials as one such
alternative route is investigated.
As pointed out by Ovshinsky [1, 2] some phase-change material should be capable
of non-binary arithmetic processing, multi-value logic and biological (neuromorphic)
type processing. In this thesis, generic, nanometre-sized, phase-change pseudodevices
were fabricated and utilised to perform various types of computational
operations for the first time, including addition, subtraction, division, parallel
factorization and logic using a novel resistive switching accumulator-type regime in
the electrical domain. The same accumulator response is also shown to provide an
electronic mimic of an integrate-and-fire type neuron. The accumulator-type regime
uses fast electrical pulses to gradually crystallize a phase-change device in a finite
number of steps and does not require a multilevel detection scheme.
The phase-change materials used in this study were protected by a capping layer
of sputtered amorphous carbon. It was found that this amorphous carbon layer also
underwent a form of resistive switching when subjected to electrical pulses. In
particular, sputtered amorphous carbon layers were found to switch from an initially
high resistivity state to a low resistivity state when a voltage pulse was locally
applied using a Conductive Atomic Force Microscope (CAFM) tip. Further
experiments on amorphous carbon vertical pseudo-devices and lithographically
defined planar devices showed that it has potential as a new material for Resistive
Random Access Memory (ReRam) applications. The switching mechanism was
identified as clustering of the sp2 hybridized carbon sites induced by Joule heating.
It was not possible to reset the devices back to their initial high resistivity state
presumably due to the highly conductive nature of sputtered amorphous carbon.
Doctoral Theses
Doctoral College
Item views 0
Full item downloads 0