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dc.contributor.authorGemo, E
dc.contributor.authorKesava, SV
dc.contributor.authorRuiz De Galarreta, C
dc.contributor.authorTrimby, L
dc.contributor.authorGarcía-Cuevas Carrillo, S
dc.contributor.authorRiede, M
dc.contributor.authorBaldycheva, A
dc.contributor.authorAlexeev, A
dc.contributor.authorWright, CD
dc.date.accessioned2020-07-08T13:40:23Z
dc.date.issued2020-06-25
dc.description.abstractPhase-change materials, such as the well-known ternary alloy Ge2Sb2Te5, are essential to many types of photonic devices, from re-writeable optical disk memories to more recent developments such as phase-change displays, reconfigurable optical metasurfaces, and integrated phase-change photonic devices and systems. The successful design and development of such applications and devices requires accurate knowledge of the complex refractive index of the phase-change material being used. To this end, it is common practice to rely on published experimental refractive index data. However, published values can vary quite significantly for notionally the same composition, no doubt due to variations in fabrication/deposition processes. Rather than rely on published data, a more reliable approach to index determination is to measure the properties of as-fabricated films, and this is usually carried out using specialized and dedicated ellipsometric equipment. In this paper, we propose a simple and effective alternative to ellipsometry, based on spectroscopic reflectance measurements of Fabry–Perot phase-change nanocavities. We describe this alternative approach in detail, apply it to measurement of the complex index of the archetypal phase-change materials Ge2Sb2Te5 and GeTe, and compare the results to those obtained using conventional ellipsometry, where we find good agreement.en_GB
dc.description.sponsorshipEngineering and Physical Sciences Research Council (EPSRC)en_GB
dc.description.sponsorshipEuropean Union Horizon 2020en_GB
dc.description.sponsorshipScience and Technology Facilities Council (STFC)en_GB
dc.identifier.citationVol. 10 (7), pp. 1675-1686en_GB
dc.identifier.doi10.1364/ome.395353
dc.identifier.grantnumberEP/M015173/1en_GB
dc.identifier.grantnumberEP/M015130/1en_GB
dc.identifier.grantnumberEP/L015331/1en_GB
dc.identifier.grantnumber780848en_GB
dc.identifier.grantnumberST/R002754/1en_GB
dc.identifier.urihttp://hdl.handle.net/10871/121829
dc.language.isoenen_GB
dc.publisherOptical Societyen_GB
dc.rights© 2020. Open access. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.en_GB
dc.titleSimple technique for determining the refractive index of phase-change materials using near-infrared reflectometryen_GB
dc.typeArticleen_GB
dc.date.available2020-07-08T13:40:23Z
dc.descriptionThis is the final version. Available on open access from the Optical Society via the DOI in this recorden_GB
dc.identifier.eissn2159-3930
dc.identifier.journalOptical Materials Expressen_GB
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_GB
dcterms.dateAccepted2020-06-12
exeter.funder::Engineering and Physical Sciences Research Council (EPSRC)en_GB
exeter.funder::Engineering and Physical Sciences Research Council (EPSRC)en_GB
exeter.funder::Engineering and Physical Sciences Research Council (EPSRC)en_GB
exeter.funder::European Commissionen_GB
exeter.funder::Engineering and Physical Sciences Research Council (EPSRC)en_GB
exeter.funder::Engineering and Physical Sciences Research Council (EPSRC)en_GB
exeter.funder::Engineering and Physical Sciences Research Council (EPSRC)en_GB
rioxxterms.versionVoRen_GB
rioxxterms.licenseref.startdate2020-06-12
rioxxterms.typeJournal Article/Reviewen_GB
refterms.dateFCD2020-07-08T12:57:47Z
refterms.versionFCDVoR
refterms.dateFOA2020-07-08T13:40:26Z
refterms.panelBen_GB


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© 2020. Open access. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
Except where otherwise noted, this item's licence is described as © 2020. Open access. Published by The Optical Society under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.