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dc.contributor.authorZhang, KZ
dc.contributor.authorNguyen, T
dc.contributor.authorEdwards, C
dc.contributor.authorAntognozzi, M
dc.contributor.authorMiles, M
dc.contributor.authorHerrmann, G
dc.date.accessioned2021-09-24T08:18:25Z
dc.date.issued2021-10-21
dc.description.abstractOne major functionality of force microscopes is their ability to measure forces at a high sensitivity, thereby, allowing understanding of vital mechanisms: for instance, in bio-specimens. The investigation of a specimen’s viscoelasticity on nano-scale can have significant scientific impact, but has been inhibited by the lack of fast, comprehensive scanning instruments. In principle, transverse dynamic force microscopes (TDFMs) permit the measurement of interaction forces within delicate samples in a non-contact manner. The force measurements are reconstructed via complicated offline analysis in TDFMs, therefore, they can hardly be utilised as an online force measuring tool. This paper introduces a novel integrated robust design for practical scanning using the TDFM system. The digital design is implemented in fixed-point arithmetic using Field Programmable Gate Array (FPGA) devices, thereby, permitting measurement of the interaction force at a high sampling rate. The novel digital design tackles different implementation issues achieving fast and robust force measuring performance. This enables a new force-scan mode for the TDFM, realising for the first time, online force mapping of sample-surfaces in real-time.en_GB
dc.description.sponsorshipEngineering and Physical Sciences Research Council (EPSRC)en_GB
dc.identifier.citationPublished online 21 October 2021en_GB
dc.identifier.doi10.1109/TIE.2021.3120487
dc.identifier.grantnumberEP/I034831/2en_GB
dc.identifier.grantnumberEP/I034882/1en_GB
dc.identifier.urihttp://hdl.handle.net/10871/127227
dc.language.isoenen_GB
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_GB
dc.rights© 2021 IEEE
dc.subjectDigital filtersen_GB
dc.subjectMechatronicsen_GB
dc.subjectNanotechnologyen_GB
dc.subjectObserversen_GB
dc.subjectParameter estimationen_GB
dc.subjectSystem dynamicsen_GB
dc.subjectScanning probe microscopyen_GB
dc.titleReal-time force reconstruction in a transverse dynamic force microscopeen_GB
dc.typeArticleen_GB
dc.date.available2021-09-24T08:18:25Z
dc.identifier.issn0278-0046
dc.descriptionThis is the author accepted manuscript. The final version is available from IEEE via the DOI in this recorden_GB
dc.identifier.eissn1557-9948
dc.identifier.journalIEEE Transactions on Industrial Electronicsen_GB
dc.rights.urihttp://www.rioxx.net/licenses/all-rights-reserveden_GB
dcterms.dateAccepted2021-08-31
exeter.funder::Engineering and Physical Sciences Research Council (EPSRC)en_GB
rioxxterms.versionAMen_GB
rioxxterms.licenseref.startdate2021-08-31
rioxxterms.typeJournal Article/Reviewen_GB
refterms.dateFCD2021-09-22T18:52:00Z
refterms.versionFCDAM
refterms.dateFOA2021-12-06T15:12:40Z
refterms.panelBen_GB


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