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dc.contributor.authorThiruppandiaraj, E
dc.contributor.authorDas, S
dc.date.accessioned2024-02-12T10:27:04Z
dc.date.issued2024-02-09
dc.date.updated2024-02-11T21:54:27Z
dc.description.abstractIn the context of real-world applications like medical imaging systems, tracking, astronomical imaging, navigation, and remote sensing (RS), there is a pressing need to enhance or upscale images with minimal errors. This is particularly critical for tasks such as target detection, image classification, and land use mapping. However, remote sensing images often suffer from limitations in spatial, spectral, radiometric, and temporal resolution due to complex atmospheric conditions and sensor constraints. Additionally, acquiring these images can be expensive and time-consuming. In this study, we propose a Single Image Super-Resolution (SISR) method to address these challenges by upscaling low-quality remote sensing images to higher resolution, enabling a better understanding of these images. We also discuss the specific challenges in remote sensing super-resolution techniques and review various upscaling approaches, while analyzing the impact of other factors like weather conditions, image capture time, and different scene types on the technique’s effectiveness.en_GB
dc.identifier.citation2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech), Kolkata, India, 18-20 December 2023en_GB
dc.identifier.doihttps://doi.org/10.1109/iementech60402.2023.10423556
dc.identifier.urihttp://hdl.handle.net/10871/135298
dc.identifierORCID: 0000-0002-8394-5303 (Das, Saptarshi)
dc.language.isoenen_GB
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_GB
dc.rights© 2024 IEEEen_GB
dc.subjectImage enhancementen_GB
dc.subjectremote sensingen_GB
dc.subjectsuper-resolution (SR)en_GB
dc.subjectconvolutional neural networks (CNNs)en_GB
dc.titleRemote Sensing Single Image Super-Resolution Benchmarking with Transfer Learning Algorithmsen_GB
dc.typeConference paperen_GB
dc.date.available2024-02-12T10:27:04Z
dc.identifier.isbn979-8-3503-0551-7
dc.identifier.issn2767-9934
dc.descriptionThis is the author accepted manuscript. The final version is available from IEEE via the DOI in this recorden_GB
dc.rights.urihttp://www.rioxx.net/licenses/all-rights-reserveden_GB
rioxxterms.versionAMen_GB
rioxxterms.licenseref.startdate2024-02-09
rioxxterms.typeConference Paper/Proceeding/Abstracten_GB
refterms.dateFCD2024-02-12T10:26:00Z
refterms.versionFCDAM
refterms.dateFOA2024-02-12T10:27:09Z
refterms.panelBen_GB
pubs.name-of-conference2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)


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