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dc.contributor.authorAlyami, L
dc.contributor.authorDas, S
dc.date.accessioned2024-02-12T10:33:37Z
dc.date.issued2024-02-09
dc.date.updated2024-02-11T22:02:45Z
dc.description.abstractIn state estimation problems, the Kalman filter (KF) algorithm considers the noise in the measurements and the systems facilitating convergence to the true state. This paper presents the Bayesian derivation of the discrete-time KF algorithm for a simple example known as the random walk model. However, if the KF coefficients are not well-tuned, it can significantly impact the estimation accuracy and may lead to algorithmic inconsistency. The Kalman gain is a quantitative measure which plays a crucial role in achieving the optimum convergence and stability. In this study, we evaluate the importance of the Kalman gain in the KF algorithm across several choices of the error covariance within the context of the random walk model. Furthermore, we demonstrate that the optimal Kalman gain is determined by minimizing the mean squared error (MSE), producing an unbiased and efficient estimate. This adaptive adjustment enables the KF to tune parameters easily. The theoretical and numerical investigations were carried out using the random walk plus noise model.en_GB
dc.identifier.citation2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech), Kolkata, India, 18-20 December 2023en_GB
dc.identifier.doihttps://doi.org/10.1109/iementech60402.2023.10423507
dc.identifier.urihttp://hdl.handle.net/10871/135299
dc.identifierORCID: 0000-0002-8394-5303 (Das, Saptarshi)
dc.language.isoenen_GB
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)en_GB
dc.rights© 2024 IEEEen_GB
dc.subjectKalman filteren_GB
dc.subjectKalman gainen_GB
dc.subjectconvergenceen_GB
dc.subjectrandom walk modelen_GB
dc.subjectstate estimationen_GB
dc.subjectnoise covarianceen_GB
dc.titleThe Role of Kalman Gain and Noise Covariance Selection on the Convergence in State Estimationen_GB
dc.typeConference paperen_GB
dc.date.available2024-02-12T10:33:37Z
dc.identifier.isbn979-8-3503-0551-7
dc.identifier.issn2767-9934
dc.descriptionThis is the author accepted manuscript. The final version is available from IEEE via the DOI in this recorden_GB
dc.rights.urihttp://www.rioxx.net/licenses/all-rights-reserveden_GB
rioxxterms.versionAMen_GB
rioxxterms.licenseref.startdate2024-02-09
rioxxterms.typeConference Paper/Proceeding/Abstracten_GB
refterms.dateFCD2024-02-12T10:32:35Z
refterms.versionFCDAM
refterms.dateFOA2024-02-12T10:33:45Z
refterms.panelBen_GB
pubs.name-of-conference2023 7th International Conference on Electronics, Materials Engineering & Nano-Technology (IEMENTech)


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