Morphology analysis of PEEK 450G using scanning electron microscopy directly on fast scanning calorimetry chips

Abstract

To explore the morphology of polyetheretherketone (PEEK), this study employed fast scanning calorimetry (FSC) and scanning electron microscopy (SEM). The objective was to observe the PEEK microstructure under various thermal profiles replicating the additive manufacturing material extrusion process. Samples were observed using SEM directly from the FSC chips, allowing high-accuracy evaluation of the microstructure relative to the thermal profiles. This approach allowed for the evaluation of the microstructure with high accuracy concerning the thermal profiles to which the samples were previously exposed. Each sample was coated with a 10 nm layer of gold–palladium (20–80% ratio), and no etching was necessary to observe the micro features of the microstructure. The approach enabled successful observation and quantification of PEEK microstructure, linking substrate temperature and temperature peaks to microstructural outcomes. Notably, temperature peaks during the process enhanced the formation of well-developed, thick lamellae due to increased chain mobility. Additionally, embryos formed post-remelting of the substrate structure were observed.