Modelling interfacial coupling in thin film magnetic exchange springs at finite temperature
Journal of Applied Physics
American Institute of Physics (AIP)
We report a numerical study that demonstrates the interface layer between a soft and hard magnetic phase, the exchange transition layer, is the dominant factor that influences the magnetization reversal process at room temperature and long measurement times. It is found that the exchange transition layer thickness affects the magnetization reversal and the coupling of a bi-layer system by lowering the switching field and changing the angle dependent magnetization reversal. We show that the change in angle dependence of reversal is due to an increased incoherency in the lateral spin behavior. Changing the value of exchange coupling in the exchange transition layer affects only the angle dependent behavior and does not lower the switching field. © 2013 AIP Publishing LLC.
We would like to thank the EPSRC for financial support under Grant Nos. EP/G032440/1 and EP/G032300/1, the WWTF Project MA09-029 and the Royal Society UF080837.
This is the final version of the article. Available from the American Institute of Physics via the DOI in this record.
Vol. 114 (15), article 153908