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dc.contributor.authorNguyen, T
dc.contributor.authorKhan, SG
dc.contributor.authorHatano, T
dc.contributor.authorZhang, K
dc.contributor.authorEdwards, C
dc.contributor.authorHerrmann, G
dc.contributor.authorHarniman, R
dc.contributor.authorBurgess, SC
dc.contributor.authorAntognozzi, M
dc.contributor.authorMiles, M
dc.date.accessioned2016-08-11T10:44:34Z
dc.date.issued2016-12-21
dc.description.abstractThis paper describes a sliding mode observer scheme for estimation of the shear force affecting the cantilever in a Transverse Dynamic Force Microscope (TDFM). The vertically oriented cantilever is oscillated in proximity to the specimen under investigation. The amplitude of oscillation of the cantilever tip is affected by these shear forces. They are created by the ordered-water layer above the specimen. The oscillation amplitude is therefore a measure of distance between the tip and the surface of the specimen. Consequently, the estimation of the shear forces provides useful information about the specimen characteristics. For estimating the shear forces, an approximate finite dimensional model of the cantilever is created using the method of lines. This model is subsequently reduced for its model order. An unknown input sliding mode observer has been used to reconstruct the unknown shear forces using only tip position measurements and the cantilever excitation. This paper describes the development of the sliding mode scheme and presents experimental results from the TDFM set up at the Centre for Nanoscience and Quantum Information (NSQI) at Bristol University.en_GB
dc.identifier.citationFirst published: 21 December 2016en_GB
dc.identifier.doi10.1002/asjc.1416
dc.identifier.urihttp://hdl.handle.net/10871/22969
dc.language.isoenen_GB
dc.publisherWileyen_GB
dc.rights© 2016 The Authors. Asian Journal of Control published by Chinese Automatic Control Society and John Wiley & Sons Australia, Ltd. This is an open access article under the terms of the Creative Commons Attribution License, which permits use, distribution and reproduction in any medium, provided the original work is properly cited.
dc.subjectTransverse Dynamic Force Microscopeen_GB
dc.subjectNano Systemsen_GB
dc.titleReal-time sliding mode observer scheme for shear force estimation in a transverse dynamic force microscopeen_GB
dc.typeArticleen_GB
dc.identifier.issn1934-6093
dc.descriptionThis is the author accepted manuscript. The final version is available from Wiley via the DOI in this record.
dc.identifier.journalAsian Journal of Controlen_GB


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