Development of an optoelectronic test station for novel phasechange device characterisation and development

Abstract

Optoelectronic applications of phase-change devices are of increasing interest and importance. To enable the proper experimental characterisation of device optoelectronic properties, and to allow for the future development of device designs with improved optoelectronic performance, we have constructed an optoelectronic test station that can simultaneously measure the optical and electrical properties of phase-change devices with high optical resolution and with high electrical bandwidths. The design of this test station, and some preliminary test applications are described.