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dc.contributor.authorHibbins, Alastair P.en_GB
dc.contributor.authorSambles, J. Royen_GB
dc.contributor.authorLawrence, Christopher R.en_GB
dc.contributor.departmentUniversity of Exeter; Defence Evaluation and Research Agency, Farnboroughen_GB
dc.date.accessioned2008-04-22T16:06:55Zen_GB
dc.date.accessioned2011-01-25T11:54:57Zen_GB
dc.date.accessioned2013-03-20T13:08:42Z
dc.date.issued1999-08-15en_GB
dc.description.abstractThis work presents a detailed investigation of electromagnetic coupling to the surface plasmon-polariton (SPP) at microwave frequencies. We have recorded the wavelength-dependent reflectivity from a metallic sinusoidal diffraction grating of pitch 15 mm. In order to minimize the problems associated with nonplanar incident wavefronts, we have developed an apparatus that collimates the incident beam. We illustrate resonant coupling to the SPP at wavelengths of the order of 10 mm. The wavelength-dependent reflectivities recorded have been successfully fitted using a differential formalism of conical diffraction with a single set of grating parameters describing the grating profile and metal permittivity.en_GB
dc.identifier.citationVol. 86 (4), pp. 1791-1795en_GB
dc.identifier.doi10.1063/1.370970en_GB
dc.identifier.urihttp://hdl.handle.net/10036/24032en_GB
dc.language.isoenen_GB
dc.publisherAmerican Institute of Physicsen_GB
dc.subjectsurface plasmonsen_GB
dc.subjectpolaritonsen_GB
dc.subjectelectromagnetic couplingen_GB
dc.subjectreflectivityen_GB
dc.subjectdiffraction gratingsen_GB
dc.titleGrating-coupled surface plasmons at microwave frequenciesen_GB
dc.typeArticleen_GB
dc.date.available2008-04-22T16:06:55Zen_GB
dc.date.available2011-01-25T11:54:57Zen_GB
dc.date.available2013-03-20T13:08:42Z
dc.identifier.issn0021-8979en_GB
dc.descriptionCopyright © 1999 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics 86 (1999) and may be found at: http://link.aip.org/link/?JAPIAU/86/1791/1en_GB
dc.identifier.journalJournal of Applied Physicsen_GB


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