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dc.contributor.authorHibbins, Alastair P.en_GB
dc.contributor.authorSambles, J. Royen_GB
dc.contributor.authorLawrence, Christopher R.en_GB
dc.contributor.departmentUniversity of Exeter; Defence Evaluation and Research Agency, Farnboroughen_GB
dc.date.accessioned2008-04-22T16:07:57Zen_GB
dc.date.accessioned2011-01-25T11:55:01Zen_GB
dc.date.accessioned2013-03-20T13:26:55Z
dc.date.issued2000-02-25en_GB
dc.description.abstractIt is shown that an absorbing dielectric layer, sinusoidally modulated in height, on top of a planar metal substrate, may be used to provide coupling between both s- and p-polarized incident microwave photons and surface plasmon polaritons, which propagate along the metal–dielectric interface. The study is carried out using paraffin wax as the dielectric material on an aluminum-alloy plate and the wax is sufficiently thick such that it may also support a guided mode. Energy reradiated from these excited modes into diffracted orders is recorded by monitoring the specular beam reflectivity as a function of wavelength (7.5<λ0<11.3 mm) and azimuthal angle of incidence (0°<φ<90°). The azimuthal-angle-dependent reflectivity scans are fitted using a multilayer, multishape differential formalism to model conical diffraction with a single set of parameters describing the grating profile, and the permittivity and thickness of the wax layer.en_GB
dc.identifier.citationVol. 87 (6), pp. 2677-2683en_GB
dc.identifier.doi10.1063/1.372241en_GB
dc.identifier.urihttp://hdl.handle.net/10036/24033en_GB
dc.language.isoenen_GB
dc.publisherAmerican Institute of Physicsen_GB
dc.subjectpolaritonsen_GB
dc.subjectsurface plasmonsen_GB
dc.subjectelectromagnetic wave polarisationen_GB
dc.subjectmetal-insulator boundariesen_GB
dc.subjectreflectivityen_GB
dc.subjectdiffraction gratingsen_GB
dc.subjectmicrowave propagationen_GB
dc.titleThe coupling of microwave radiation to surface plasmon polaritons and guided modes via dielectric gratingsen_GB
dc.typeArticleen_GB
dc.date.available2008-04-22T16:07:57Zen_GB
dc.date.available2011-01-25T11:55:01Zen_GB
dc.date.available2013-03-20T13:26:55Z
dc.identifier.issn0021-8979en_GB
dc.descriptionCopyright © 2000 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics 87 (2000) and may be found at http://link.aip.org/link/?JAPIAU/87/2677/1en_GB
dc.identifier.journalJournal of Applied Physicsen_GB


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