Sensing using differential surface plasmon ellipsometry

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Sensing using differential surface plasmon ellipsometry

Show simple item record Hooper, Ian R. en_GB Sambles, J. Roy en_GB
dc.contributor.department University of Exeter en_GB 2008-06-06T11:04:59Z en_GB 2011-01-25T11:54:45Z en_US 2013-03-20T13:13:25Z 2004 en_GB
dc.description.abstract In this work a differential ellipsometric method utilizing surface plasmons (SPs) for monitoring refractive index changes, which could be used in chemical and biological sensors, is presented. The method is based upon determining the azimuth of elliptically polarized light reflected from a Kretschmann SP system, resulting from linearly polarized light containing both p and s components incident upon it. The sensitivity of this azimuth to the refractive index of a dielectric on the nonprism side of the metal film is demonstrated both experimentally and theoretically. The smallest refractive index change which is resolvable is of the order of 10–7 refractive index units, although it is believed that this could be improved upon were it not for experimental constraints due to atmospheric changes and vibrations. The method requires the Kretschmann configuration to be oriented at a fixed angle, and the SP to be excited at a fixed wavelength. With no moving parts this method would be particularly robust from an application point of view. en_GB
dc.identifier.citation 96 (5), pp. 3004-3011 en_GB
dc.identifier.doi 10.1063/1.1778218 en_GB
dc.identifier.uri en_GB
dc.language.iso en en_GB
dc.publisher American Institute of Physics en_GB
dc.relation.url en_GB
dc.relation.url en_GB
dc.subject refractive index en_GB
dc.subject surface plasmon resonance en_GB
dc.subject reflectivity en_GB
dc.subject ellipsometry en_GB
dc.subject biosensors en_GB
dc.subject chemical sensors en_GB
dc.subject sensitivity en_GB
dc.title Sensing using differential surface plasmon ellipsometry en_GB
dc.type Article en_GB 2008-06-06T11:04:59Z en_GB 2011-01-25T11:54:45Z en_US 2013-03-20T13:13:25Z
dc.identifier.issn 0021-8979 en_GB
dc.description Copyright © 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics 96 (2004) and may be found at en_GB
dc.identifier.journal Journal of Applied Physics en_GB

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