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Temperature dependence of the interface moments in Co2MnSi thin films

dc.contributor.authorTelling, N.D.en_GB
dc.contributor.authorKeatley, Paul Stevenen_GB
dc.contributor.authorShelford, L.R.en_GB
dc.contributor.authorArenholz, E.en_GB
dc.contributor.authorvan der Laan, Gerriten_GB
dc.contributor.authorHicken, R.J.en_GB
dc.contributor.authorSakuraba, Y.en_GB
dc.contributor.authorTsunegi, S.en_GB
dc.contributor.authorOogane, M.en_GB
dc.contributor.authorAndo, Y.en_GB
dc.contributor.authorTakanashi, K.en_GB
dc.contributor.authorMiyazaki, T.en_GB
dc.date.accessioned2013-01-11T15:10:21Zen_GB
dc.date.accessioned2013-03-20T13:08:15Z
dc.date.issued2008-05-12en_GB
dc.description.abstractX-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co2MnSi (CMS) thin films capped with aluminum. By increasing the thickness of the capping layer, we demonstrate enhanced interface sensitivity of the measurements. L2(1)-ordered CMS films show no significant temperature dependence of either the Co or Mn interface moments. However, disordered CMS films show a decreased moment at low temperature possibly caused by increased Mn-Mn antiferromagnetic coupling. It is suggested that for ordered L2(1) CMS films the temperature dependence of the tunneling magnetoresistance is not related to changes in the interface moments.en_GB
dc.identifier.citationVol. 92 (19), article 192503en_GB
dc.identifier.doi10.1063/1.2927482en_GB
dc.identifier.urihttp://hdl.handle.net/10036/4155en_GB
dc.language.isoenen_GB
dc.publisherAmerican Institute of Physicsen_GB
dc.relation.urlhttp://dx.doi.org/10.1063/1.2927482en_GB
dc.subjectmagnetic tunnel junctionsen_GB
dc.subjectspin polarizationen_GB
dc.subjectmagnetoresistanceen_GB
dc.subjectspectroscopyen_GB
dc.subjectaluminiumen_GB
dc.subjectantiferromagnetismen_GB
dc.subjectcobalt alloysen_GB
dc.subjectinterface magnetismen_GB
dc.subjectmagnetic circular dichroismen_GB
dc.subjectmagnetic thin filmsen_GB
dc.subjectmanganese alloysen_GB
dc.subjectsilicon alloysen_GB
dc.subjecttunnelling magnetoresistanceen_GB
dc.subjectX-ray absorption spectraen_GB
dc.titleTemperature dependence of the interface moments in Co2MnSi thin filmsen_GB
dc.typeArticleen_GB
dc.date.available2013-01-11T15:10:21Zen_GB
dc.date.available2013-03-20T13:08:15Z
dc.identifier.issn0003-6951en_GB
exeter.article-number192503en_GB
dc.descriptionCopyright © 2008 American Institute of Physicsen_GB
dc.identifier.eissn1077-3118en_GB
dc.identifier.journalApplied Physics Lettersen_GB


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