Evidence of a barrier oxidation dependence on the interfacial magnetism in Co/alumina based magnetic tunnel junctions
van der Laan, Gerrit
Journal of Applied Physics
American Institute of Physics
Soft x-ray absorption spectroscopy and magnetic circular dichroism at the Co L-2,L-3 edge have been applied to explore the near-interfacial magnetism of Co electrodes in Co/alumina based magnetic tunnel junctions. By taking into account the formation of CoO at the ferromagnetic (FM)/barrier interface, the change in the total magnetic moment on metallic Co atoms as a function of barrier oxidation has been determined. The results demonstrate a strong correlation between the Co moments and measured TMR values, and an enhancement in the Co moments for moderate oxidation times.
Copyright © 2006 American Institute of Physics
Vol. 99 (8), article 08E505
Showing items related by title, author, creator and subject.
Shelford, L.R.; Liu, Y.; Hicken, R.J.; Sakuraba, Y.; Oogane, M.; Ando, Y. (American Institute of Physics, 2008)We have studied magnetic second harmonic generation (MSHG) at the Co2MnSi/AlOx interface. The variation of the MSHG intensity was consistent with the nonvanishing components of the nonlinear susceptibility tensor expected ...
Generation of Propagating Spin Waves from Edges of Magnetic Nanostructures Pumped by Uniform Microwave Magnetic Field Davies, CS; Kruglyak, VV (Institute of Electrical and Electronics Engineers (IEEE), 2016-01-12)Thin-film patterned magnetic nanostructures are widely employed within perceived magnonic device architectures to guide and/or manipulate spin waves for data processing and communication purposes. Here, using micromagnetic ...
Telling, N.D.; Keatley, Paul Steven; Shelford, L.R.; Arenholz, E.; van der Laan, Gerrit; Hicken, R.J.; Sakuraba, Y.; Tsunegi, S.; Oogane, M.; Ando, Y.; Takanashi, K.; Miyazaki, T. (American Institute of Physics, 2008-05-12)X-ray magnetic circular dichroism (XMCD) is utilized to explore the temperature dependence of the interface moments in Co2MnSi (CMS) thin films capped with aluminum. By increasing the thickness of the capping layer, we ...