Magnetic second harmonic generation at the Co2MnSi/AlO x interface
dc.contributor.author | Shelford, L.R. | en_GB |
dc.contributor.author | Liu, Y. | en_GB |
dc.contributor.author | Hicken, R.J. | en_GB |
dc.contributor.author | Sakuraba, Y. | en_GB |
dc.contributor.author | Oogane, M. | en_GB |
dc.contributor.author | Ando, Y. | en_GB |
dc.date.accessioned | 2013-01-18T12:12:25Z | en_GB |
dc.date.accessioned | 2013-03-20T13:12:38Z | |
dc.date.issued | 2008-04-14 | en_GB |
dc.description.abstract | We have studied magnetic second harmonic generation (MSHG) at the Co2MnSi/AlOx interface. The variation of the MSHG intensity was consistent with the nonvanishing components of the nonlinear susceptibility tensor expected for the (001) cubic surface. The difference in the MSHG asymmetry, the MSHG anisotropy, is found to have maximum value at an annealing temperature of 450 °C, for which similar samples have previously been found to show optimum L21 site ordering and maximum tunnel magnetoresistance. | en_GB |
dc.identifier.citation | Vol. 103 (7), article 07D720 | en_GB |
dc.identifier.doi | 10.1063/1.2841174 | en_GB |
dc.identifier.uri | http://hdl.handle.net/10036/4179 | en_GB |
dc.publisher | American Institute of Physics | en_GB |
dc.subject | aluminium compounds | en_GB |
dc.subject | cobalt alloys | en_GB |
dc.subject | interface magnetism | en_GB |
dc.subject | light polarisation | en_GB |
dc.subject | magnetic anisotropy | en_GB |
dc.subject | magnetic annealing | en_GB |
dc.subject | magnetic epitaxial layers | en_GB |
dc.subject | magnetic tunnelling | en_GB |
dc.subject | magneto-optical effects | en_GB |
dc.subject | magnetoresistance | en_GB |
dc.subject | manganese alloys | en_GB |
dc.subject | nonlinear optical susceptibility | en_GB |
dc.subject | optical harmonic generation | en_GB |
dc.subject | silicon alloys | en_GB |
dc.title | Magnetic second harmonic generation at the Co2MnSi/AlO x interface | en_GB |
dc.type | Article | en_GB |
dc.date.available | 2013-01-18T12:12:25Z | en_GB |
dc.date.available | 2013-03-20T13:12:38Z | |
dc.identifier.issn | 0021-8979 | en_GB |
dc.description | Copyright © 2008 American Institute of Physics | en_GB |
dc.identifier.eissn | 1089-7550 | en_GB |
dc.identifier.journal | Journal of Applied Physics | en_GB |