| dc.contributor.author | Kruglyak, V.V. | en_GB |
| dc.contributor.author | Hicken, R.J. | en_GB |
| dc.contributor.author | Ali, M. | en_GB |
| dc.contributor.author | Hickey, B.J. | en_GB |
| dc.contributor.author | Pym, A.T.G. | en_GB |
| dc.contributor.author | Tanner, B.K. | en_GB |
| dc.date.accessioned | 2013-01-21T10:10:38Z | en_GB |
| dc.date.accessioned | 2013-03-20T13:10:52Z | |
| dc.date.issued | 2005-06-16 | en_GB |
| dc.description.abstract | Time-resolved ellipsometric measurements were made upon Au, Cu, Ag, Ni, Pd, Ti, Zr, and Hf thin films. Using an elliptically polarized pump beam, the decay of the optically induced polarization of the sample was observed. Characteristic relaxation times are extracted and interpreted in terms of scattering of linear and angular momentum of hot electrons. A systematic variation is observed between different metals that reflects their underlying band structure. | en_GB |
| dc.identifier.citation | Vol. 71 (23), article 233104 | en_GB |
| dc.identifier.doi | 10.1103/PhysRevB.71.233104 | en_GB |
| dc.identifier.uri | http://hdl.handle.net/10036/4184 | en_GB |
| dc.language.iso | en | en_GB |
| dc.publisher | American Physical Society | en_GB |
| dc.title | Measurement of hot electron momentum relaxation times in metals by femtosecond ellipsometry | en_GB |
| dc.type | Article | en_GB |
| dc.date.available | 2013-01-21T10:10:38Z | en_GB |
| dc.date.available | 2013-03-20T13:10:52Z | |
| dc.identifier.issn | 1098-0121 | en_GB |
| dc.description | Copyright © 2005 The American Physical Society | en_GB |
| dc.identifier.eissn | 1550-235X | en_GB |
| dc.identifier.journal | Physical Review B - Condensed Matter and Materials Physics | en_GB |
