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dc.contributor.authorKruglyak, V.V.en_GB
dc.contributor.authorHicken, R.J.en_GB
dc.contributor.authorAli, M.en_GB
dc.contributor.authorHickey, B.J.en_GB
dc.contributor.authorPym, A.T.G.en_GB
dc.contributor.authorTanner, B.K.en_GB
dc.date.accessioned2013-01-21T10:10:38Zen_GB
dc.date.accessioned2013-03-20T13:10:52Z
dc.date.issued2005en_GB
dc.description.abstractTime-resolved ellipsometric measurements were made upon Au, Cu, Ag, Ni, Pd, Ti, Zr, and Hf thin films. Using an elliptically polarized pump beam, the decay of the optically induced polarization of the sample was observed. Characteristic relaxation times are extracted and interpreted in terms of scattering of linear and angular momentum of hot electrons. A systematic variation is observed between different metals that reflects their underlying band structure.en_GB
dc.identifier.citationVol. 71 (23), article 233104en_GB
dc.identifier.doi10.1103/PhysRevB.71.233104en_GB
dc.identifier.urihttp://hdl.handle.net/10036/4184en_GB
dc.language.isoenen_GB
dc.publisherAmerican Physical Societyen_GB
dc.relation.urlhttp://dx.doi.org/10.1103/PhysRevB.71.233104en_GB
dc.relation.urlhttp://link.aps.org/doi/10.1103/PhysRevB.71.233104en_GB
dc.titleMeasurement of hot electron momentum relaxation times in metals by femtosecond ellipsometryen_GB
dc.typeArticleen_GB
dc.date.available2013-01-21T10:10:38Zen_GB
dc.date.available2013-03-20T13:10:52Z
dc.identifier.issn1098-0121en_GB
dc.descriptionCopyright © 2005 The American Physical Societyen_GB
dc.identifier.eissn1550-235Xen_GB
dc.identifier.journalPhysical Review B - Condensed Matter and Materials Physicsen_GB


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