Use of microscale coplanar striplines with indium tin oxide windows in optical ferromagnetic resonance measurements

Abstract

It is shown that a coplanar stripline structure containing indium tin oxide windows can be used to perform optical ferromagnetic resonance measurements on a sample grown on an opaque substrate, using a pulsed magnetic field of any desired orientation. The technique is demonstrated by applying it to a thin film of permalloy grown on a Si substrate. The measured precession frequency was found to be in good agreement with macrospin simulations. The phase of the oscillatory Kerr response was observed to vary as the probe spot was scanned across the coplanar stripline structure, confirming that the orientation of the pulsed field varied from parallel to perpendicular relative to the plane of the sample.