Microwaves: thin metal slits and liquid crystals

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Microwaves: thin metal slits and liquid crystals

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dc.contributor.author Sambles, J. Roy en_GB
dc.contributor.author Hibbins, Alastair P. en_GB
dc.contributor.author Kelly, Robert J. en_GB
dc.contributor.author Suckling, James R. en_GB
dc.contributor.author Yang, Fuzi en_GB
dc.contributor.department University of Exeter; Tsinghua University, Beijing en_GB
dc.date.accessioned 2009-01-21T11:37:13Z en_GB
dc.date.accessioned 2011-01-25T11:54:58Z en_US
dc.date.accessioned 2013-03-20T13:02:45Z
dc.date.issued 2004 en_GB
dc.description.abstract Using liquid crystals to control the propagation of microwaves is a potentially interesting technology. By incorporating small amounts of liquid crystal in thin slat metal structures through which the microwaves may resonantly pass a whole new range of voltage tuned microwave devices are becoming available. Metallic sub-wavelength slit structures at microwave frequencies have been constructed which show Fabry-Perot type resonances in very thin slits. If the dielectric in such thin slits is an aligned liquid crystal it is found possible to voltage-control the resonant frequencies. Novel selective filters and structures for microwave beam steering have been fabricated leading to a new generation of liquid crystal controlled devices. en_GB
dc.identifier.citation Vol. 5618, pp. 1-14 en_GB
dc.identifier.doi 10.1117/12.580829 en_GB
dc.identifier.uri http://hdl.handle.net/10036/47817 en_GB
dc.language.iso en en_GB
dc.publisher SPIE en_GB
dc.relation.url http://dx.doi.org/10.1117/12.580829 en_GB
dc.subject transmission en_GB
dc.subject sub-wavelength aperture en_GB
dc.subject slit en_GB
dc.subject microwave en_GB
dc.subject resonant filters en_GB
dc.title Microwaves: thin metal slits and liquid crystals en_GB
dc.type Meetings and Proceedings en_GB
dc.date.available 2009-01-21T11:37:13Z en_GB
dc.date.available 2011-01-25T11:54:58Z en_US
dc.date.available 2013-03-20T13:02:45Z
dc.identifier.issn 0277-786X en_GB
dc.description Copyright © 2004 Society of Photo-Optical Instrumentation Engineers. This paper was published in Proceedings of SPIE Volume 5618, pp. 1-14 and is made available with permission of SPIE. One print or electronic copy may be made for personal use only. Systematic or multiple reproduction, distribution to multiple locations via electronic or other means, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited. en_GB
dc.identifier.journal Proceedings of SPIE en_GB


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