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dc.contributor.authorButler, Celia A.M.en_GB
dc.contributor.authorParsons, Jamesen_GB
dc.contributor.authorSambles, J. Royen_GB
dc.contributor.authorHibbins, Alastair P.en_GB
dc.contributor.authorHobson, Peter A.en_GB
dc.date.accessioned2009-11-13T16:10:15Zen_GB
dc.date.accessioned2011-01-25T11:54:03Zen_GB
dc.date.accessioned2013-03-20T13:18:39Z
dc.date.issued2009-10-26en_GB
dc.description.abstractA metamaterial layer comprising of a conducting square mesh surrounding subwavelength holes has a largely pure imaginary effective refractive index. We explore the microwave transmissivity of a stack of such metamaterial layers separated by dielectric spacers. As expected, a family of high transmissivity bands is experimentally observed. It is found that the lowest frequency edge is independent of the number of unit cells making up the structure and is highly tunable by appropriate geometrical design of the metamaterial layers.en_GB
dc.identifier.citationVol. 95 (17), article 174101en_GB
dc.identifier.doi10.1063/1.3253703en_GB
dc.identifier.urihttp://hdl.handle.net/10036/86196en_GB
dc.language.isoenen_GB
dc.publisherAmerican Institute of Physicsen_GB
dc.subjectdielectric materialsen_GB
dc.subjectlight transmissionen_GB
dc.subjectmetamaterialsen_GB
dc.subjectmicrowave propagationen_GB
dc.subjectrefractive indexen_GB
dc.subjectthin filmsen_GB
dc.titleMicrowave transmissivity of a metamaterial–dielectric stacken_GB
dc.typeArticleen_GB
dc.date.available2009-11-13T16:10:15Zen_GB
dc.date.available2011-01-25T11:54:03Zen_GB
dc.date.available2013-03-20T13:18:39Z
dc.identifier.issn0003-6951en_GB
dc.descriptionCopyright © 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters 95 (2009) and may be found at http://link.aip.org/link/?APPLAB/95/174101/1en_GB
dc.identifier.journalApplied Physics Lettersen_GB


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