Microwave transmissivity of a metamaterial–dielectric stack

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Microwave transmissivity of a metamaterial–dielectric stack

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dc.contributor.author Butler, Celia A.M. en_GB
dc.contributor.author Parsons, James en_GB
dc.contributor.author Sambles, J. Roy en_GB
dc.contributor.author Hibbins, Alastair P. en_GB
dc.contributor.author Hobson, Peter A. en_GB
dc.date.accessioned 2009-11-13T16:10:15Z en_GB
dc.date.accessioned 2011-01-25T11:54:03Z en_US
dc.date.accessioned 2013-03-20T13:18:39Z
dc.date.issued 2009 en_GB
dc.description.abstract A metamaterial layer comprising of a conducting square mesh surrounding subwavelength holes has a largely pure imaginary effective refractive index. We explore the microwave transmissivity of a stack of such metamaterial layers separated by dielectric spacers. As expected, a family of high transmissivity bands is experimentally observed. It is found that the lowest frequency edge is independent of the number of unit cells making up the structure and is highly tunable by appropriate geometrical design of the metamaterial layers. en_GB
dc.identifier.citation 95 (17), article 174101 en_GB
dc.identifier.doi 10.1063/1.3253703 en_GB
dc.identifier.uri http://hdl.handle.net/10036/86196 en_GB
dc.language.iso en en_GB
dc.publisher American Institute of Physics en_GB
dc.relation.url http://dx.doi.org/10.1063/1.3253703 en_GB
dc.relation.url http://link.aip.org/link/?APPLAB/95/174101/1 en_GB
dc.subject dielectric materials en_GB
dc.subject light transmission en_GB
dc.subject metamaterials en_GB
dc.subject microwave propagation en_GB
dc.subject refractive index en_GB
dc.subject thin films en_GB
dc.title Microwave transmissivity of a metamaterial–dielectric stack en_GB
dc.type Article en_GB
dc.date.available 2009-11-13T16:10:15Z en_GB
dc.date.available 2011-01-25T11:54:03Z en_US
dc.date.available 2013-03-20T13:18:39Z
dc.identifier.issn 0003-6951 en_GB
dc.description Copyright © 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters 95 (2009) and may be found at http://link.aip.org/link/?APPLAB/95/174101/1 en_GB
dc.identifier.journal Applied Physics Letters en_GB


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