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dc.contributor.authorMosca, S
dc.contributor.authorDey, P
dc.contributor.authorSalimi, M
dc.contributor.authorGardner, B
dc.contributor.authorPalombo, F
dc.contributor.authorStone, N
dc.contributor.authorMatousek, P
dc.date.accessioned2021-04-22T11:07:28Z
dc.date.issued2021-04-22
dc.description.abstractSpatially Offset Raman Spectroscopy (SORS) is a technique for interrogating subsurface composition of turbid samples noninvasively. This study generically addresses a fundamental question relevant to a wide range of SORS studies, which is, how deep SORS probes for any specific spatial offset when analyzing a turbid sample. Or in turn, what magnitude of spatial offset one should select to probe a specific depth. This issue is addressed by using Monte Carlo simulations, under the assumption of negligible absorption, which establishes that the key parameter governing the extent of the probed zone for a point-like illumination and point-like collection SORS geometry is the reduced scattering coefficient of the medium. This can either be deduced from literature data or directly estimated from a SORS measurement by evaluating the Raman intensity profile from multiple spatial offsets. Once this is known, the extent of the probed zone can be determined for any specific SORS spatial offset using the Monte Carlo simulation results presented here. The proposed method was tested using experimental data on stratified samples by analyzing the signal detected from a thin layer moved through a stack of layers using both non-absorbing and absorbing samples. The proposed simple methodology provides important additional information on SORS measurements with direct relevance to a wide range of SORS applications including biomedical, pharmaceutical, security, forensics, and cultural heritage.en_GB
dc.description.sponsorshipEngineering and Physical Sciences Research Council (EPSRC)en_GB
dc.identifier.citationPublished online 22 April 2021en_GB
dc.identifier.doi10.1021/acs.analchem.1c00490
dc.identifier.grantnumberEP/R020965/1en_GB
dc.identifier.urihttp://hdl.handle.net/10871/125442
dc.language.isoenen_GB
dc.publisherAmerican Chemical Societyen_GB
dc.rights© 2021 The Authors. Published by American Chemical Society. Open access under a CC BY 4.0 licence: https://creativecommons.org/licenses/by/4.0/
dc.titleSpatially Offset Raman Spectroscopy — How Deep?en_GB
dc.typeArticleen_GB
dc.date.available2021-04-22T11:07:28Z
dc.identifier.issn0003-2700
dc.descriptionThis is the final version. Available on open access from the American Chemical Society via the DOI in this record.en_GB
dc.identifier.journalAnalytical Chemistryen_GB
dc.rights.urihttps://creativecommons.org/licenses/by/4.0/en_GB
dcterms.dateAccepted2021-04-12
exeter.funder::Engineering and Physical Sciences Research Council (EPSRC)en_GB
rioxxterms.versionVoRen_GB
rioxxterms.licenseref.startdate2021-04-12
rioxxterms.typeJournal Article/Reviewen_GB
refterms.dateFCD2021-04-22T09:44:40Z
refterms.versionFCDAM
refterms.dateFOA2021-04-29T12:59:18Z
refterms.panelBen_GB


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© 2021 The Authors. Published by American Chemical Society. Open access under a CC BY 4.0 licence: https://creativecommons.org/licenses/by/4.0/
Except where otherwise noted, this item's licence is described as © 2021 The Authors. Published by American Chemical Society. Open access under a CC BY 4.0 licence: https://creativecommons.org/licenses/by/4.0/