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dc.contributor.authorSun, Q
dc.contributor.authorFalak, P
dc.contributor.authorVettenburg, T
dc.contributor.authorLee, T
dc.contributor.authorPhillips, DB
dc.contributor.authorBrambilla, G
dc.contributor.authorBeresna, M
dc.date.accessioned2022-12-09T10:21:16Z
dc.date.issued2022-09-26
dc.date.updated2022-12-08T16:33:02Z
dc.description.abstractRandom scattering of light in disordered media can be used for highly sensitive speckle-based wavemeters and spectrometers. However, the multiple scattering events that fold long optical paths within a compact space also make such devices exceedingly sensitive to vibrations and small disturbances to the disordered media. Here, we show how scattering can be engineered so that it can be used for a compact computational spectrometer that is largely insensitive to environmental factors. We designed and fabricated a three-dimensional pseudo-random nano-void pattern with 62% scattering efficiency. The controlled amount of multiple scattering ensured a sufficiently long optical path for the target resolution of 100 pm, with optimal long-term stability. The 200-μm-thick scattering silica substrate was integrated in a compact assembly with a low-cost camera sensor. The target resolution was achieved for full spectrum measurements while single wavelengths could be determined with 50 pm resolution. Such tailored scattering systems can improve the trade-off among cost, size, stability, and spectral resolution in computational spectrometers.en_GB
dc.description.sponsorshipEuropean Research Councilen_GB
dc.description.sponsorshipUK Research and Innovationen_GB
dc.description.sponsorshipEngineering and Physical Sciences Research Councilen_GB
dc.description.sponsorshipRoyal Academy of Engineeringen_GB
dc.format.extent2328-
dc.identifier.citationVol. 10, No. 10, pp. 2328-36en_GB
dc.identifier.doihttps://doi.org/10.1364/prj.465322
dc.identifier.grantnumber804626en_GB
dc.identifier.grantnumberMR/S034900/1en_GB
dc.identifier.grantnumberEP/N00762X/1en_GB
dc.identifier.urihttp://hdl.handle.net/10871/131984
dc.identifierORCID: 0000-0002-3711-4787 (Phillips, David B)
dc.language.isoenen_GB
dc.publisherOpticaen_GB
dc.relation.urlhttps://eprints.soton.ac.uk/468356/en_GB
dc.rights© The Author(s). Published by Chinese Laser Press under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.en_GB
dc.titleCompact nano-void spectrometer based on a stable engineered scattering systemen_GB
dc.typeArticleen_GB
dc.date.available2022-12-09T10:21:16Z
dc.identifier.issn2327-9125
dc.descriptionThis is the final version. Available from Optica via the DOI in this record. en_GB
dc.descriptionData Availability Data underlying the results presented in this paper are available in Ref. [32]. 32. Q. Sun and P. Falak, “Compact nano-void spectrometer based on a stable engineered scattering system–dataset,” University of Southampton Repository, https://eprints.soton.ac.uk/468356/ (2022).en_GB
dc.identifier.journalPhotonics Researchen_GB
dc.relation.ispartofPhotonics Research, 10(10)
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/en_GB
dcterms.dateAccepted2022-08-05
rioxxterms.versionVoRen_GB
rioxxterms.licenseref.startdate2022-09-26
rioxxterms.typeJournal Article/Reviewen_GB
refterms.dateFCD2022-12-09T10:08:25Z
refterms.versionFCDVoR
refterms.dateFOA2022-12-09T10:21:36Z
refterms.panelBen_GB
refterms.dateFirstOnline2022-09-26


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© The Author(s). Published by Chinese Laser Press under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.
Except where otherwise noted, this item's licence is described as © The Author(s). Published by Chinese Laser Press under the terms of the Creative Commons Attribution 4.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.