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dc.contributor.authorDíaz-Rubio, Ana
dc.contributor.authorHibbins, Alastair P.
dc.contributor.authorCarbonell, Jorge
dc.contributor.authorSanchez-Dehesa, Jose
dc.date.accessioned2015-06-22T09:03:00Z
dc.date.issued2015-06-19
dc.description.abstractThis work presents an experimental demonstration of total absorption by a metal-dielectric metasurface. Following a theoretical proposal [Díaz-Rubio et al., Phys. Rev. B 89, 245123 (2014)], we have designed and fabricated a metasurface consisting of a low absorbing dielectric layer (made of FR4) placed on top of a metallic surface patterned with a square array of coaxial cavities. For p-polarized waves, a low frequency peak with perfect absorption is observed. The behavior of this peak has been experimentally characterized for different dielectric layer thicknesses, coaxial cavity lengths, and angles of incidence. The experimental results are in excellent agreement with numerical simulation and corroborate the theoretical predictions.en_GB
dc.description.sponsorshipSpanish Ministerio de Economía y Competitividad (MINECO)en_GB
dc.description.sponsorshipUSA office of Naval Researchen_GB
dc.identifier.citationVol. 106 (24), article 241604en_GB
dc.identifier.doi10.1063/1.4922801
dc.identifier.grantnumberTEC2010-19751en_GB
dc.identifier.grantnumberN000141210216en_GB
dc.identifier.grantnumberEEBB-I-1408331en_GB
dc.identifier.urihttp://hdl.handle.net/10871/17638
dc.language.isoenen_GB
dc.publisherAmerican Institute of Physics (AIP)en_GB
dc.subjectDielectric thin filmsen_GB
dc.subjectAbsorption spectraen_GB
dc.subjectDielectric materialsen_GB
dc.subjectDiffraction gratingsen_GB
dc.subjectAntennasen_GB
dc.titleExperimental verification of total absorption by a low-loss thin dielectric layeren_GB
dc.typeArticleen_GB
dc.date.available2015-06-22T09:03:00Z
dc.identifier.issn0003-6951
exeter.article-number24
dc.descriptionCopyright © 2015 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, Volume 106 (24), article 241604, and may be found at http://dx.doi.org/10.1063/1.4922801en_GB
dc.identifier.eissn1077-3118
dc.identifier.journalApplied Physics Lettersen_GB


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