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dc.contributor.authorLaitinen, Antti
dc.contributor.authorParaoanu, G.S.
dc.contributor.authorOksanen, Mika
dc.contributor.authorCraciun, Monica F.
dc.contributor.authorRusso, Saverio
dc.contributor.authorSonin, Edouard
dc.contributor.authorHakonen, Pertti
dc.date.accessioned2015-12-01T13:50:00Z
dc.date.issued2015-09-13
dc.description.abstractThe inherent asymmetry of the electric transport in graphene is attributed to Klein tunneling across barriers defined by pn-interfaces between positively and negatively charged regions. By combining conductance and shot noise experiments we determine the structure of the tunneling barrier in a high-quality suspended sample with Au/Cr/Au contacts. We observe an asymmetric resistance Rodd=100−70 Ω across the Dirac point at carrier density |n|=0.3−4⋅1011 cm−2, while the Fano factor displays a non-monotonic asymmetry in the range Fodd∼0.03−0.1. Our findings agree with Klein tunneling calculations based on the Dirac equation with a trapezoidal barrier. Comparison between the model and the data yields the barrier height for tunneling, an estimate of the thickness of the interface d<20 nm, and the contact region doping corresponding to a Fermi level offset of ∼−18 meV. Strong pinning of the Fermi level under the metallic contact is observed due to large contact capacitance.en_GB
dc.identifier.urihttp://hdl.handle.net/10871/18836
dc.language.isoenen_GB
dc.publisherarXiv.orgen_GB
dc.relation.urlhttp://arxiv.org/abs/1502.04330en_GB
dc.titleKlein tunneling, contact doping, and pn-interfaces in gated suspended grapheneen_GB
dc.typeArticleen_GB
dc.date.available2015-12-01T13:50:00Z
dc.identifier.journalarXiven_GB


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