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dc.contributor.authorEl-Bana, MS
dc.contributor.authorWolverson, D
dc.contributor.authorHorsell, D.W.
dc.contributor.authorBending, SJ
dc.date.accessioned2016-02-10T14:52:56Z
dc.date.issued2014-11-01
dc.description.abstractWe have systematically studied quantum transport in a short trilayer-graphene field-effect transistor. Close to the charge neutrality point, our magnetoconductance data are well described by the theory of weak localization in monolayer graphene. However, as the carrier density is increased we find a complex evolution of the low field magnetoconductance that originates from a combination of the monolayer-like and bilayer-like band structures. The increased phase coherence length at high hole densities takes our shortest devices into the mesoscopic regime with the appearance of significant conductance fluctuations on top of the localization effects. Although these are aperiodic in gate voltage, they exhibit a quasi-periodic behaviour as a function of magnetic field. We show that this is consistent with the interference of discrete trajectories in open quantum dots and discuss the possible origin of these in our devices.en_GB
dc.description.sponsorshipEngineering and Physical Sciences Research Councilen_GB
dc.identifier.citationSemiconductor Science and Technology, 2014, Vol. 29, Issue 11, Article number 115010en_GB
dc.identifier.doi10.1088/0268-1242/29/11/115010
dc.identifier.grantnumberEP/G036101/1en_GB
dc.identifier.urihttp://hdl.handle.net/10871/19683
dc.language.isoenen_GB
dc.publisherIOP Publishingen_GB
dc.relation.urlhttp://www.scopus.com/record/display.uri?eid=2-s2.0-84908042726&origin=inward&txGid=0en_GB
dc.rights© 2014 IOP Publishing Ltd.en_GB
dc.titleLocalization and field-periodic conductance fluctuations in trilayer grapheneen_GB
dc.typeArticleen_GB
dc.date.available2016-02-10T14:52:56Z
dc.identifier.issn0268-1242
dc.descriptionThis is an author-created, un-copyedited version of an article accepted for publication/published in Semiconductor Science and Technology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at DOI 10.1088/0268-1242/29/11/115010.en_GB
dc.identifier.journalSemiconductor Science and Technologyen_GB


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