Experimental verification of increased optical contrast in nanometer phase change films
Institute of Electrical and Electronics Engineers (IEEE)
The optoelectronic properties of phase change materials (PCMs) have been recently demonstrated for novel applications such as solid state nanodisplays. The thickness of the active PCM layer in particular is of critical importance. In this paper we verify experimentally this fundamental relationship between thickness and optical contrast. Our results show that further scaling into future 2D PCM materials, although counterintuitive, would benefit both the electrical and optoelectronic properties of such devices.
This is the author accepted manuscript. The final version is available from IEEE
2015 IEEE 15th International Conference on Nanotechnology (IEEE-NANO), 27-30 July 2015, Rome, Italy