Experimental verification of increased optical contrast in nanometer phase change films

Abstract

The optoelectronic properties of phase change materials (PCMs) have been recently demonstrated for novel applications such as solid state nanodisplays. The thickness of the active PCM layer in particular is of critical importance. In this paper we verify experimentally this fundamental relationship between thickness and optical contrast. Our results show that further scaling into future 2D PCM materials, although counterintuitive, would benefit both the electrical and optoelectronic properties of such devices.