dc.contributor.author | Corbett, AD | |
dc.contributor.author | Gil Leyva, D | |
dc.contributor.author | Diaz-Santana, L | |
dc.contributor.author | Wilkinson, TD | |
dc.contributor.author | Zhong, JJ | |
dc.date.accessioned | 2017-08-07T07:54:09Z | |
dc.date.issued | 2006-06-08 | |
dc.description.abstract | The accurate measurement of the double-pass ocular wave front has been shown to have a broad range of applications from LASIK surgery to adaptively corrected retinal imaging. The ocular wave front can be accurately described by a small number of Zernike circle polynomials. The modal wave front sensor was first proposed by Neil et al. and allows the coefficients of the individual Zernike modes to be measured directly. Typically the aberrations measured with the modal sensor are smaller than those seen in the ocular wave front. In this work, we investigated a technique for adapting a modal phase mask for the sensing of the ocular wave front. This involved extending the dynamic range of the sensor by increasing the pinhole size to 2.4mm and optimising the mask bias to 0.75λ. This was found to decrease the RMS error by up to a factor of three for eye-like aberrations with amplitudes up to 0.2μm. For aberrations taken from a sample of real-eye measurements a 20% decrease in the RMS error was observed. | en_GB |
dc.identifier.citation | Vol. 6018, 601808 | en_GB |
dc.identifier.doi | 10.1117/12.669247 | |
dc.identifier.uri | http://hdl.handle.net/10871/28800 | |
dc.language.iso | en | en_GB |
dc.publisher | Society of Photo-optical Instrumentation Engineers (SPIE) | en_GB |
dc.rights | © (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only. | en_GB |
dc.subject | Modal wave front sensing | en_GB |
dc.subject | Ocular aberrations | en_GB |
dc.title | Characterising a holographic modal phase mask for the detection of ocular aberrations | en_GB |
dc.type | Article | en_GB |
dc.date.available | 2017-08-07T07:54:09Z | |
dc.identifier.issn | 0277-786X | |
dc.description | This is the final version of the article. Available from Society of Photo-optical Instrumentation Engineers (SPIE) via the DOI in this record. | en_GB |
dc.identifier.eissn | 1996-756X | |
dc.identifier.journal | Proceedings of SPIE - The International Society for Optical Engineering | en_GB |