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dc.contributor.authorCorbett, AD
dc.contributor.authorGil Leyva, D
dc.contributor.authorDiaz-Santana, L
dc.contributor.authorWilkinson, TD
dc.contributor.authorZhong, JJ
dc.date.accessioned2017-08-07T07:54:09Z
dc.date.issued2006-06-08
dc.description.abstractThe accurate measurement of the double-pass ocular wave front has been shown to have a broad range of applications from LASIK surgery to adaptively corrected retinal imaging. The ocular wave front can be accurately described by a small number of Zernike circle polynomials. The modal wave front sensor was first proposed by Neil et al. and allows the coefficients of the individual Zernike modes to be measured directly. Typically the aberrations measured with the modal sensor are smaller than those seen in the ocular wave front. In this work, we investigated a technique for adapting a modal phase mask for the sensing of the ocular wave front. This involved extending the dynamic range of the sensor by increasing the pinhole size to 2.4mm and optimising the mask bias to 0.75λ. This was found to decrease the RMS error by up to a factor of three for eye-like aberrations with amplitudes up to 0.2μm. For aberrations taken from a sample of real-eye measurements a 20% decrease in the RMS error was observed.en_GB
dc.identifier.citationVol. 6018, 601808en_GB
dc.identifier.doi10.1117/12.669247
dc.identifier.urihttp://hdl.handle.net/10871/28800
dc.language.isoenen_GB
dc.publisherSociety of Photo-optical Instrumentation Engineers (SPIE)en_GB
dc.rights© (2005) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.en_GB
dc.subjectModal wave front sensingen_GB
dc.subjectOcular aberrationsen_GB
dc.titleCharacterising a holographic modal phase mask for the detection of ocular aberrationsen_GB
dc.typeArticleen_GB
dc.date.available2017-08-07T07:54:09Z
dc.identifier.issn0277-786X
dc.descriptionThis is the final version of the article. Available from Society of Photo-optical Instrumentation Engineers (SPIE) via the DOI in this record.en_GB
dc.identifier.eissn1996-756X
dc.identifier.journalProceedings of SPIE - The International Society for Optical Engineeringen_GB


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