A Multi-mode Transverse Dynamic Force Microscope - Design, Identification and Control
Zhang, K; Herrmann, G; Edwards, C; et al.Antognozzi, M; Hatano, T; Nguyen, T; Burgess, SC; Miles, M
Date: 2 July 2019
Journal
IEEE Transactions on Industrial Electronics
Publisher
Institute of Electrical and Electronics Engineers
Publisher DOI
Abstract
The transverse dynamic force microscope
(TDFM) and its shear force sensing principle permit true
non-contact force detection in contrast to typical atomic
force microscopes. The two TDFM measurement signals
for the cantilever allow, in principle, two different scanning
modes of which, in particular, the second presented here
permits ...
The transverse dynamic force microscope
(TDFM) and its shear force sensing principle permit true
non-contact force detection in contrast to typical atomic
force microscopes. The two TDFM measurement signals
for the cantilever allow, in principle, two different scanning
modes of which, in particular, the second presented here
permits a full-scale non-contact scan. Previous research
mainly focused on developing the sensing mechanism,
whereas this work investigates the vertical axis dynamics
for advanced robust closed-loop control. This paper
presents a new TDFM digital control solution, built on
field-programmable gate array (FPGA) equipment running
at high implementation frequencies. The integrated control
system allows the implementation of online customizable
controllers, and raster-scans in two modes at very high
detection bandwidth and nano-precision. Robust control
algorithms are designed, implemented, and practically assessed.
The two realized scanning modes are experimentally
evaluated by imaging nano-spheres with known dimensions
in wet conditions.
Engineering
Faculty of Environment, Science and Economy
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