dc.contributor.author | Zhang, K | |
dc.contributor.author | Herrmann, G | |
dc.contributor.author | Edwards, C | |
dc.contributor.author | Antognozzi, M | |
dc.contributor.author | Hatano, T | |
dc.contributor.author | Nguyen, T | |
dc.contributor.author | Burgess, SC | |
dc.contributor.author | Miles, M | |
dc.date.accessioned | 2019-06-17T11:45:31Z | |
dc.date.issued | 2019-07-02 | |
dc.description.abstract | The transverse dynamic force microscope
(TDFM) and its shear force sensing principle permit true
non-contact force detection in contrast to typical atomic
force microscopes. The two TDFM measurement signals
for the cantilever allow, in principle, two different scanning
modes of which, in particular, the second presented here
permits a full-scale non-contact scan. Previous research
mainly focused on developing the sensing mechanism,
whereas this work investigates the vertical axis dynamics
for advanced robust closed-loop control. This paper
presents a new TDFM digital control solution, built on
field-programmable gate array (FPGA) equipment running
at high implementation frequencies. The integrated control
system allows the implementation of online customizable
controllers, and raster-scans in two modes at very high
detection bandwidth and nano-precision. Robust control
algorithms are designed, implemented, and practically assessed.
The two realized scanning modes are experimentally
evaluated by imaging nano-spheres with known dimensions
in wet conditions. | en_GB |
dc.description.sponsorship | Engineering and Physical Sciences Research Council (EPSRC) | en_GB |
dc.identifier.citation | Published online 02 July 2019. | en_GB |
dc.identifier.doi | 10.1109/TIE.2019.2924618 | |
dc.identifier.grantnumber | EP/I034831/2 | en_GB |
dc.identifier.uri | http://hdl.handle.net/10871/37554 | |
dc.language.iso | en | en_GB |
dc.publisher | Institute of Electrical and Electronics Engineers | en_GB |
dc.rights | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | |
dc.subject | Nano-precision control | en_GB |
dc.subject | Fixed-point implementation | en_GB |
dc.subject | Control arithmetic optimization | en_GB |
dc.subject | Scanning-probe microscopy | en_GB |
dc.title | A Multi-mode Transverse Dynamic Force Microscope - Design, Identification and Control | en_GB |
dc.type | Article | en_GB |
dc.date.available | 2019-06-17T11:45:31Z | |
dc.identifier.issn | 0278-0046 | |
dc.description | This is the author accepted manuscript. The final version is available from IEEE via the DOI in this record. | en_GB |
dc.identifier.journal | IEEE Transactions on Industrial Electronics | en_GB |
dc.rights.uri | http://www.rioxx.net/licenses/all-rights-reserved | en_GB |
dcterms.dateAccepted | 2019-06-01 | |
exeter.funder | ::Engineering and Physical Sciences Research Council (EPSRC) | en_GB |
rioxxterms.version | AM | en_GB |
rioxxterms.licenseref.startdate | 2019-06-01 | |
rioxxterms.type | Journal Article/Review | en_GB |
refterms.dateFCD | 2019-06-15T15:23:12Z | |
refterms.versionFCD | AM | |
refterms.dateFOA | 2019-07-10T12:45:01Z | |
refterms.panel | B | en_GB |