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dc.contributor.authorLockyear, Matthew J.en_GB
dc.contributor.authorHibbins, Alastair P.en_GB
dc.contributor.authorSambles, J. Royen_GB
dc.contributor.authorLawrence, Christopher R.en_GB
dc.contributor.departmentUniversity of Exeter; QinetiQ Ltd, Farnboroughen_GB
dc.date.accessioned2008-04-17T15:27:11Zen_GB
dc.date.accessioned2011-01-25T11:53:44Zen_GB
dc.date.accessioned2013-03-20T13:19:42Z
dc.date.issued2004en_GB
dc.description.abstractStrongly enhanced transmission of microwave radiation (λ0~5 mm) is observed through a single subwavelength circular aperture of diameter d = 2.5 mm in a metallic plate. The phenomenon is caused by resonant excitation of electromagnetic surface waves supported by four concentric grooves surrounding the aperture on the illuminated side of the sample. It is also shown that similar surface patterning on the output face of the sample results in very strong angular confinement (directivity) of the transmitted beam. A finite element code is used to investigate the electromagnetic fields on both the illuminated and the exit side of the structure, the predictions from which show excellent agreement with the experimental results.en_GB
dc.identifier.citation84 (12), pp. 2040-2042en_GB
dc.identifier.doi10.1063/1.1688001en_GB
dc.identifier.urihttp://hdl.handle.net/10036/23692en_GB
dc.language.isoenen_GB
dc.publisherAmerican Institute of Physicsen_GB
dc.relation.urlhttp://dx.doi.org/10.1063/1.1688001en_GB
dc.relation.urlhttp://link.aip.org/link/?APPLAB/84/2040/1en_GB
dc.subjectmicrowave propagationen_GB
dc.subjectelectromagnetic wave transmissionen_GB
dc.subjectfinite element analysisen_GB
dc.subjectelectromagnetic wave propagationen_GB
dc.subjectradiowave propagationen_GB
dc.titleSurface-topography-induced enhanced transmission and directivity of microwave radiation through a subwavelength circular metal apertureen_GB
dc.typeArticleen_GB
dc.date.available2008-04-17T15:27:11Zen_GB
dc.date.available2011-01-25T11:53:44Zen_GB
dc.date.available2013-03-20T13:19:42Z
dc.identifier.issn0003-6951en_GB
dc.descriptionCopyright © 2004 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters 84 (2004) and may be found at http://link.aip.org/link/?APPLAB/84/2040/1en_GB
dc.identifier.journalApplied Physics Lettersen_GB


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