Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons
Isaac, Thomas Henry; Barnes, William L.; Hendry, Euan
Date: 19 December 2008
Journal
Applied Physics Letters
Publisher
American Institute of Physics
Publisher DOI
Abstract
By employing a combination of time-domain measurements and numerical calculations, we demonstrate that the semiconductor InSb supports a strongly confined surface plasmon (SP) in the terahertz frequency range. We show that these SPs can be used to enhance the light-matter interaction with dielectric layers above the semiconductor ...
By employing a combination of time-domain measurements and numerical calculations, we demonstrate that the semiconductor InSb supports a strongly confined surface plasmon (SP) in the terahertz frequency range. We show that these SPs can be used to enhance the light-matter interaction with dielectric layers above the semiconductor surface, thereby allowing us to detect the presence of polystyrene layers around 1000 times thinner than the free space wavelength of the terahertz light. Finally we discuss the viability of using semiconductor SPs for the purposes of terahertz sensing and spectroscopy.
Physics and Astronomy
Faculty of Environment, Science and Economy
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