Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons

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Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons

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Title: Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons
Author: Isaac, Thomas Henry
Barnes, William L.
Hendry, Euan
Citation: 93 (24), article 241115
Publisher: American Institute of Physics
Journal: Applied Physics Letters
Date Issued: 2008
URI: http://hdl.handle.net/10036/47369
DOI: 10.1063/1.3049350
Links: http://dx.doi.org/10.1063/1.3049350 http://link.aip.org/link/?APPLAB/93/241115/1
Abstract: By employing a combination of time-domain measurements and numerical calculations, we demonstrate that the semiconductor InSb supports a strongly confined surface plasmon (SP) in the terahertz frequency range. We show that these SPs can be used to enhance the light-matter interaction with dielectric layers above the semiconductor surface, thereby allowing us to detect the presence of polystyrene layers around 1000 times thinner than the free space wavelength of the terahertz light. Finally we discuss the viability of using semiconductor SPs for the purposes of terahertz sensing and spectroscopy.
Type: Article
Description: Copyright © 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters 93 (2008) and may be found at http://link.aip.org/link/?APPLAB/93/241115/1
Keywords: III-V semiconductorsindium compoundssemiconductor thin filmssubmillimetre wave spectrasurface plasmons
ISSN: 0003-6951


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