Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons

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Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons

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dc.contributor.author Isaac, Thomas Henry en_GB
dc.contributor.author Barnes, William L. en_GB
dc.contributor.author Hendry, Euan en_GB
dc.contributor.department University of Exeter en_GB
dc.date.accessioned 2009-01-13T17:16:39Z en_GB
dc.date.accessioned 2011-01-25T11:54:07Z en_US
dc.date.accessioned 2013-03-20T13:18:59Z
dc.date.issued 2008 en_GB
dc.description.abstract By employing a combination of time-domain measurements and numerical calculations, we demonstrate that the semiconductor InSb supports a strongly confined surface plasmon (SP) in the terahertz frequency range. We show that these SPs can be used to enhance the light-matter interaction with dielectric layers above the semiconductor surface, thereby allowing us to detect the presence of polystyrene layers around 1000 times thinner than the free space wavelength of the terahertz light. Finally we discuss the viability of using semiconductor SPs for the purposes of terahertz sensing and spectroscopy. en_GB
dc.identifier.citation 93 (24), article 241115 en_GB
dc.identifier.doi 10.1063/1.3049350 en_GB
dc.identifier.uri http://hdl.handle.net/10036/47369 en_GB
dc.language.iso en en_GB
dc.publisher American Institute of Physics en_GB
dc.relation.url http://dx.doi.org/10.1063/1.3049350 en_GB
dc.relation.url http://link.aip.org/link/?APPLAB/93/241115/1 en_GB
dc.subject III-V semiconductors en_GB
dc.subject indium compounds en_GB
dc.subject semiconductor thin films en_GB
dc.subject submillimetre wave spectra en_GB
dc.subject surface plasmons en_GB
dc.title Determining the terahertz optical properties of subwavelength films using semiconductor surface plasmons en_GB
dc.type Article en_GB
dc.date.available 2009-01-13T17:16:39Z en_GB
dc.date.available 2011-01-25T11:54:07Z en_US
dc.date.available 2013-03-20T13:18:59Z
dc.identifier.issn 0003-6951 en_GB
dc.description Copyright © 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters 93 (2008) and may be found at http://link.aip.org/link/?APPLAB/93/241115/1 en_GB
dc.identifier.journal Applied Physics Letters en_GB


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