| dc.contributor.author | Mukherjee, A | |
| dc.contributor.author | Pakhira, A | |
| dc.contributor.author | Das, S | |
| dc.contributor.author | Pan, I | |
| dc.contributor.author | Gupta, A | |
| dc.date.accessioned | 2018-01-18T14:54:59Z | |
| dc.date.issued | 2011-08-12 | |
| dc.description.abstract | The paper presents a Stateflow based network test-bed to validate real-time optimal control algorithms. Genetic Algorithm (GA) based time domain performance index minimization is attempted for tuning of PI controller to handle a balanced lag and delay type First Order Plus Time Delay (FOPTD) process over network. The tuning performance is validated on a real-time communication network with artificially simulated stochastic delay, packet loss and out-of order packets characterizing the network. | en_GB |
| dc.description.sponsorship | This work has been supported by
the Board of Research in Nuclear Sciences (BRNS) of the Department of
Atomic Energy (DAE), India, sanction no. 2009/36/62-BRNS, dated
November 2009. | en_GB |
| dc.identifier.citation | 2011 International Conference on Process Automation, Control and Computing (PACC), Coimbatore, India, 20-22 July 2011, article 5979045 | en_GB |
| dc.identifier.doi | 10.1109/PACC.2011.5979045 | |
| dc.identifier.uri | http://hdl.handle.net/10871/31072 | |
| dc.language.iso | en | en_GB |
| dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | en_GB |
| dc.rights | © 2011 IEEE | en_GB |
| dc.subject | Delay | en_GB |
| dc.subject | Real time systems | en_GB |
| dc.subject | Mathematical model | en_GB |
| dc.subject | Stochastic processes | en_GB |
| dc.subject | Out of order | en_GB |
| dc.subject | Tuning | en_GB |
| dc.subject | Synchronization | en_GB |
| dc.title | Embedded Network Test-Bed for Validating Real-Time Control Algorithms to Ensure Optimal Time Domain Performance | en_GB |
| dc.type | Conference paper | en_GB |
| dc.date.available | 2018-01-18T14:54:59Z | |
| dc.description | This is the author accepted manuscript. The final version is available from IEEE via the DOI in this record. | en_GB |
